Advanced measurement

Bullet Description


Ceit has broad expertise in developing advanced instrumentation systems for monitoring systems, measuring critical parameters in production processes or existing products. These include methods based on:

  • Electromagnetic field-based measurement

  • Optical sensor-based measurement

  • Ultrasound-based measurement

  • Microwave-based measurement

  • Advanced sensor development

These methods have direct application in Industry 4.0, intelligent transport systems and biomedical devices, among other areas. Having a battery of measurement methods available allows Ceit to undertake projects that develop advanced monitoring systems for various sectors.