Description

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Ceit-IK4 has broad expertise in developing advanced instrumentation systems for monitoring systems, measuring critical parameters in production processes or existing products. These include methods based on:

  • Electromagnetic field-based measurement
  • Optical sensor-based measurement
  • Ultrasound-based measurement
  • Microwave-based measurement
  • Advanced sensor development

These methods have direct application in Industry 4.0, intelligent transport systems and biomedical devices, among other areas. Having a battery of measurement methods available allows Ceit-IK4 to undertake projects that develop advanced monitoring systems for various sectors.